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High On/Off Current Ratio p-InGaN/AlGaN/GaN HEMTs.
- Source :
- IEEE Electron Device Letters; Sep2012, Vol. 33 Issue 9, p1249-1251, 3p
- Publication Year :
- 2012
-
Abstract
- An excellent on/off current ratio of \10^10 and a nearly ideal subthreshold slope of 65 mV/dec was confirmed in a p-InGaN/AlGaN/GaN high-electron-mobility transistor. Favorable I–V characteristics were achieved with the p-InGaN cap layer under the gate electrode. A dry etching technique with a low-damage p-InGaN cap layer resulted in a significantly low leakage current of \10^-11\ \A/mm. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 07413106
- Volume :
- 33
- Issue :
- 9
- Database :
- Complementary Index
- Journal :
- IEEE Electron Device Letters
- Publication Type :
- Academic Journal
- Accession number :
- 79463812
- Full Text :
- https://doi.org/10.1109/LED.2012.2204854