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High On/Off Current Ratio p-InGaN/AlGaN/GaN HEMTs.

Authors :
Deguchi, Tadayoshi
Kikuchi, Toshikatsu
Arai, Manabu
Yamasaki, Kimiyoshi
Egawa, Takashi
Source :
IEEE Electron Device Letters; Sep2012, Vol. 33 Issue 9, p1249-1251, 3p
Publication Year :
2012

Abstract

An excellent on/off current ratio of \10^10 and a nearly ideal subthreshold slope of 65 mV/dec was confirmed in a p-InGaN/AlGaN/GaN high-electron-mobility transistor. Favorable I–V characteristics were achieved with the p-InGaN cap layer under the gate electrode. A dry etching technique with a low-damage p-InGaN cap layer resulted in a significantly low leakage current of \10^-11\ \A/mm. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
07413106
Volume :
33
Issue :
9
Database :
Complementary Index
Journal :
IEEE Electron Device Letters
Publication Type :
Academic Journal
Accession number :
79463812
Full Text :
https://doi.org/10.1109/LED.2012.2204854