Back to Search Start Over

Ionic conduction in different hydrated V2O5 film.

Authors :
Saatci, A. Evrim
Gökdemir, F. Pınar
Menda, U. Deneb
Kavak, Pelin
Özdemir, Orhan
Kutlu, Kubilay
Source :
AIP Conference Proceedings; 9/6/2012, Vol. 1476 Issue 1, p289-295, 7p, 2 Diagrams, 4 Graphs
Publication Year :
2012

Abstract

Because of the layered structure of vanadium pentoxide films (V<subscript>2</subscript>O<subscript>5</subscript>), approved by XRD measurement, sensitized from different hydrated V<subscript>2</subscript>O<subscript>5</subscript>.nH<subscript>2</subscript>O sols, demonstrated anisotropic conductivities in current voltage (I-V) measurement. Conductivity values, originated from electronic and ionic conductions, differed provided that measurements were performed in a direction parallel to the ribbons rather than perpendicular to them. The overall electrical conductivity of V<subscript>2</subscript>O<subscript>5</subscript>nH<subscript>2</subscript>O sols mainly depended on the hydration state n and the amount of reduced V4+ ions in which n was determined around 4-6 [1] from the basal distance (17.6 Å) through XRD measurement while V4+ ions were determined through FTIR analysis. Electronic conduction prevailed in dehydrated V<subscript>2</subscript>O<subscript>5</subscript>0.5H<subscript>2</subscript>O sols whereas non-stoichiometric vanadium pentoxide was a mixed-valence compound and its electronic properties arised from electron hopping between V4+ and V5+ ions so-called 'small polaron model'. Indeed, reduction/oxidation peaks in lithium (Li+) intercalation by cyclic voltammograms (CV) indicated the V4+ and V5+ ions in V<subscript>2</subscript>O<subscript>5</subscript> sols. Temperature dependent I-V analysis showed Arheniuss type activation energy, EA, and located in between 0.3-0.5 eV; proposing ionic conduction rather than electronic conduction, specifically proton diffusion in V<subscript>2</subscript>O<subscript>5</subscript> film. Indeed, hydration state greater than 0.5 predicted ionic conduction [1]. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0094243X
Volume :
1476
Issue :
1
Database :
Complementary Index
Journal :
AIP Conference Proceedings
Publication Type :
Conference
Accession number :
79865213
Full Text :
https://doi.org/10.1063/1.4751613