Study of Pass-Gate Voltage (VPASS) Interference in Sub-30nm Charge-Trapping (CT) NAND Flash Devices.

Details

Language :

English

ISBNs :

9781457702259

Database :

Complementary Index

Journal :

2011 3rd IEEE International Memory Workshop (IMW)

Publication Type :

Conference

Accession number :

80334289

Full Text :

https://doi.org/10.1109/IMW.2011.5873211