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Effects of RRAM Stack Configuration on Forming Voltage and Current Overshoot.
- Source :
- 2011 3rd IEEE International Memory Workshop (IMW); 2011, p1-4, 4p
- Publication Year :
- 2011
Details
- Language :
- English
- ISBNs :
- 9781457702259
- Database :
- Complementary Index
- Journal :
- 2011 3rd IEEE International Memory Workshop (IMW)
- Publication Type :
- Conference
- Accession number :
- 80334303
- Full Text :
- https://doi.org/10.1109/IMW.2011.5873225