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Well tapping methodologies in power-gating design.

Authors :
Kaijian Shi
Tester, D.
Source :
2011 IEEE International SOC Conference (SOCC); 2011, p128-131, 4p
Publication Year :
2011

Details

Language :
English
ISBNs :
9781457716164
Database :
Complementary Index
Journal :
2011 IEEE International SOC Conference (SOCC)
Publication Type :
Conference
Accession number :
80396565
Full Text :
https://doi.org/10.1109/SOCC.2011.6085133