Variability analysis of scaled poly-Si channel FinFETs and tri-gate flash memories for high density and low cost stacked 3D-memory application.

Details

Language :

English

ISBNs :

9781457707070

Database :

Complementary Index

Journal :

2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC)

Publication Type :

Conference

Accession number :

80398227

Full Text :

https://doi.org/10.1109/ESSDERC.2011.6044199