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Wide-voltage SOI-BiCDMOS technology for high-temperature automotive applications.

Authors :
Tomita, H.
Eguchi, H.
Kijima, S.
Honda, N.
Yamada, T.
Yamawaki, H.
Aoki, H.
Hamada, K.
Source :
2011 IEEE 23rd International Symposium on Power Semiconductor Devices & ICs (ISPSD); 2011, p28-31, 4p
Publication Year :
2011

Details

Language :
English
ISBNs :
9781424484256
Database :
Complementary Index
Journal :
2011 IEEE 23rd International Symposium on Power Semiconductor Devices & ICs (ISPSD)
Publication Type :
Conference
Accession number :
80406508
Full Text :
https://doi.org/10.1109/ISPSD.2011.5890782