Modeling yield of carbon-nanotube/silicon-nanowire FET-based nanoarray architecture with h-hot addressing scheme.

Details

Language :

English

ISBNs :

9780769522418

Database :

Complementary Index

Journal :

Proceedings of the 19th IEEE International Symposium on Defect & Fault Tolerance in VLSI Systems, 2004. DFT 2004

Publication Type :

Conference

Accession number :

80762622

Full Text :

https://doi.org/10.1109/DFTVS.2004.1347860