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SET and RESET pulse characterization in BJT-selected phase-change memories.
- Source :
- 2005 IEEE International Symposium on Circuits & Systems; 2005, p1270-1270, 1p
- Publication Year :
- 2005
Details
- Language :
- English
- ISBNs :
- 9780780388345
- Database :
- Complementary Index
- Journal :
- 2005 IEEE International Symposium on Circuits & Systems
- Publication Type :
- Conference
- Accession number :
- 80793018
- Full Text :
- https://doi.org/10.1109/ISCAS.2005.1464826