Study of the Influence of the Thickness of Dielectric Layer in a FED.

Details

Language :

English

ISBNs :

9781424404018

Database :

Complementary Index

Journal :

2006 19th International Vacuum Nanoelectronics Conference

Publication Type :

Conference

Accession number :

80805221

Full Text :

https://doi.org/10.1109/IVNC.2006.335262