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Noise and Dynamic Cryogenic performance of Metamorphic Transistors from 20 to 42 GHz.
- Source :
- 2006 European Microwave Integrated Circuits Conference; 2006, p9-12, 4p
- Publication Year :
- 2006
Details
- Language :
- English
- ISBNs :
- 9782960055184
- Database :
- Complementary Index
- Journal :
- 2006 European Microwave Integrated Circuits Conference
- Publication Type :
- Conference
- Accession number :
- 80819864
- Full Text :
- https://doi.org/10.1109/EMICC.2006.282736