Methodology for characterizing the impact of circuit layout, technology options, device engineering and temperature on the circuit power-delay characteristics.

Details

Language :

English

ISBNs :

9781424401673

Database :

Complementary Index

Journal :

2006 IEEE International Conference on Microelectronic Test Structures

Publication Type :

Conference

Accession number :

80832856

Full Text :

https://doi.org/10.1109/ICMTS.2006.1614282