Automated Variant Test Program Generator (Manufacturing Technologies).

Authors :: Fong Chii Biao
Goh Huan Yong
Cham Khang Wey
Source :: 2006 Thirty-First IEEE/CPMT International Electronics Manufacturing Technology Symposium; 2006, p475-480, 6p
Publication Year :: 2006

Language :: English
ISBNs :: 9781424407309
Database :: Complementary Index
Journal :: 2006 Thirty-First IEEE/CPMT International Electronics Manufacturing Technology Symposium
Publication Type :: Conference
Accession number :: 80858957
Full Text :: https://doi.org/10.1109/IEMT.2006.4456497