Second-level testing revisited and applications to NIST SP800-22.

Details

Language :

English

ISBNs :

9781424413416

Database :

Complementary Index

Journal :

2007 18th European Conference on Circuit Theory & Design

Publication Type :

Conference

Accession number :

80863163

Full Text :

https://doi.org/10.1109/ECCTD.2007.4529674