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An on-chip monitor for hot carrier induced degradation.
- Source :
- 2007 7th International Conference on ASIC; 2007, p1002-1005, 4p
- Publication Year :
- 2007
Details
- Language :
- English
- ISBNs :
- 9781424411320
- Database :
- Complementary Index
- Journal :
- 2007 7th International Conference on ASIC
- Publication Type :
- Conference
- Accession number :
- 80875829
- Full Text :
- https://doi.org/10.1109/ICASIC.2007.4415802