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Memory characteristics of top-gate ZnO nanowire field-effect transistors with floating gate nodes of Au nanoparticles.

Authors :
Donghyuk Yeom
Jeongmin Kang
Changjoon Yoon
Byoungjun Park
Kihyun Keem
Dong-Young Jeong
Mihyun Kim
Eui Kwan Koh
Sangsig Kim
Source :
2007 Digest of papers Microprocesses & Nanotechnology; 2007, p124-125, 2p
Publication Year :
2007

Details

Language :
English
ISBNs :
9784990247249
Database :
Complementary Index
Journal :
2007 Digest of papers Microprocesses & Nanotechnology
Publication Type :
Conference
Accession number :
80884649
Full Text :
https://doi.org/10.1109/IMNC.2007.4456135