Transistor Leakage Components & Effect of Leakage on VCO performance.

Authors :: Thuy Dao
Dahl, P.
Connell, L.
Bushman, M.
Source :: 2007 IEEE International Conference on Integrated Circuit Design & Technology; 2007, p1-2, 2p
Publication Year :: 2007

Language :: English
ISBNs :: 9781424407576
Database :: Complementary Index
Journal :: 2007 IEEE International Conference on Integrated Circuit Design & Technology
Publication Type :: Conference
Accession number :: 80905375
Full Text :: https://doi.org/10.1109/ICICDT.2007.4299539