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Transistor Leakage Components & Effect of Leakage on VCO performance.

Authors :
Thuy Dao
Dahl, P.
Connell, L.
Bushman, M.
Source :
2007 IEEE International Conference on Integrated Circuit Design & Technology; 2007, p1-2, 2p
Publication Year :
2007

Details

Language :
English
ISBNs :
9781424407576
Database :
Complementary Index
Journal :
2007 IEEE International Conference on Integrated Circuit Design & Technology
Publication Type :
Conference
Accession number :
80905375
Full Text :
https://doi.org/10.1109/ICICDT.2007.4299539