A 65nm Embedded SRAM with Wafer-Level Burn-In Mode, Leak-Bit Redundancy and E-Trim Fuse for Known Good Die.

Details

Language :

English

ISBNs :

9781424408535

Database :

Complementary Index

Journal :

2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers

Publication Type :

Conference

Accession number :

80912186

Full Text :

https://doi.org/10.1109/ISSCC.2007.373507