Simulation-Driven Thermal-Safe Test Time Minimization for System-on-Chip.

Details

Language :

English

ISBNs :

9780769533964

Database :

Complementary Index

Journal :

2008 17th Asian Test Symposium

Publication Type :

Conference

Accession number :

80958570

Full Text :

https://doi.org/10.1109/ATS.2008.79