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LS-SVM for bad debt risk assessment in enterprises.

Authors :
Yunlong Hu
Yongchen Li
Source :
2008 IEEE International Joint Conference on Neural Networks (IEEE World Congress on Computational Intelligence); 2008, p1665-1669, 5p
Publication Year :
2008

Details

Language :
English
ISBNs :
9781424418206
Database :
Complementary Index
Journal :
2008 IEEE International Joint Conference on Neural Networks (IEEE World Congress on Computational Intelligence)
Publication Type :
Conference
Accession number :
81020004
Full Text :
https://doi.org/10.1109/IJCNN.2008.4634021