Back to Search
Start Over
Ubiquitous relaxation in BTI stressing—New evaluation and insights.
- Source :
- 2008 IEEE International Reliability Physics Symposium; 2008, p20-27, 8p
- Publication Year :
- 2008
Details
- Language :
- English
- ISBNs :
- 9781424420490
- Database :
- Complementary Index
- Journal :
- 2008 IEEE International Reliability Physics Symposium
- Publication Type :
- Conference
- Accession number :
- 81020754
- Full Text :
- https://doi.org/10.1109/RELPHY.2008.4558858