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Cold welding: A new factor governing the robustness of adhesively bonded flip-chip interconnects.

Authors :
Farley, D.
Kahnert, T.
Sinha, K.
Solares, S.
Dasgupta, A.
Caers, J.F.J.
Zhao, X.J.
Source :
2009 59th Electronic Components & Technology Conference; 2009, p67-73, 7p
Publication Year :
2009

Details

Language :
English
ISBNs :
9781424444755
Database :
Complementary Index
Journal :
2009 59th Electronic Components & Technology Conference
Publication Type :
Conference
Accession number :
81068277
Full Text :
https://doi.org/10.1109/ECTC.2009.5073998