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Latency criticality aware on-chip communication.

Authors :
Zheng Li
Jie Wu
Li Shang
Dick, R.P.
Yihe Sun
Source :
2009 Design, Automation & Test in Europe Conference & Exhibition; 2009, p1052-1057, 6p
Publication Year :
2009

Details

Language :
English
ISBNs :
9781424437818
Database :
Complementary Index
Journal :
2009 Design, Automation & Test in Europe Conference & Exhibition
Publication Type :
Conference
Accession number :
81072243
Full Text :
https://doi.org/10.1109/date.2009.5090820