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Gate oxide protection and ggNMOSTs in 65 nm.

Authors :
Notermans, G.
Smedes, T.
Mrcarica, Z.
de Jong, P.
Stephan, R.
van Zwol, H.
Maksimovic, D.
Source :
EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium; 2008, p6-8, 3p
Publication Year :
2008

Details

Language :
English
ISBNs :
9781585371464
Database :
Complementary Index
Journal :
EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium
Publication Type :
Conference
Accession number :
81132167

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