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Thermal resistance reduction in power MOSFETs integrated in a 65nm SOI technology.
- Source :
- ESSDERC 2007 - 37th European Solid State Device Research Conference; 2007, p171-174, 4p
- Publication Year :
- 2007
Details
- Language :
- English
- ISBNs :
- 9781424411238
- Database :
- Complementary Index
- Journal :
- ESSDERC 2007 - 37th European Solid State Device Research Conference
- Publication Type :
- Conference
- Accession number :
- 81133100
- Full Text :
- https://doi.org/10.1109/ESSDERC.2007.4430906