A noise test structure for CMOS logic families.

Authors :: Graziano, M.
Masera, G.
Piccinini, G.
Zamboni, M.
Source :: ICM'99. Proceedings Eleventh International Conference on Microelectronics (IEEE Cat. No.99EX388); 2000, p93-96, 4p
Publication Year :: 2000

Language :: English
ISBNs :: 9780780366435
Database :: Complementary Index
Journal :: ICM'99. Proceedings Eleventh International Conference on Microelectronics (IEEE Cat. No.99EX388)
Publication Type :: Conference
Accession number :: 81143947
Full Text :: https://doi.org/10.1109/ICM.2000.884813