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Nanoscale Servo System of AFM using Surface Topography Learning with Perfect Tracking Control.

Authors :
Oshima, T.
Fujimoto, H.
Source :
IECON 2007 - 33rd Annual Conference of the IEEE Industrial Electronics Society; 2007, p2307-2312, 6p
Publication Year :
2007

Details

Language :
English
ISBNs :
9781424407835
Database :
Complementary Index
Journal :
IECON 2007 - 33rd Annual Conference of the IEEE Industrial Electronics Society
Publication Type :
Conference
Accession number :
81146933
Full Text :
https://doi.org/10.1109/IECON.2007.4460276