Experimental study of single-event transient current in SOI devices.

Authors :: Hirao, T.
Shibata, T.
Laird, J.S.
Onoda, S.
Takabashi, Y.
Ohnishi, K.
Kamiya, T.
Source :: Proceedings of the 7th European Conference on Radiation & Its Effects on Components & Systems, 2003 (RADECS 2003); 2003, p305-309, 5p
Publication Year :: 2003

Language :: English
ISBNs :: 9789290928461
Database :: Complementary Index
Journal :: Proceedings of the 7th European Conference on Radiation & Its Effects on Components & Systems, 2003 (RADECS 2003)
Publication Type :: Conference
Accession number :: 81244070
Full Text :: https://doi.org/10.1109/RADECS.2003.185675