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RF and noise properties of SOI MOSFETs, including the influence of a direct tunneling gate current.
- Source :
- Proceedings of the Fifth IEEE International Caracas Conference on Devices, Circuits & Systems, 2004; 2004, p103-110, 8p
- Publication Year :
- 2004
Details
- Language :
- English
- ISBNs :
- 9780780387775
- Database :
- Complementary Index
- Journal :
- Proceedings of the Fifth IEEE International Caracas Conference on Devices, Circuits & Systems, 2004
- Publication Type :
- Conference
- Accession number :
- 81245832
- Full Text :
- https://doi.org/10.1109/ICCDCS.2004.1393363