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A comparative approach of low frequency noise in 0.25 and 0.12 μm Partially and Fully Depleted SOI N-MOSFETs.
- Source :
- IEEE International 2002 SOI Conference; 2002, p105-106, 2p
- Publication Year :
- 2002
Details
- Language :
- English
- ISBNs :
- 9780780374393
- Database :
- Complementary Index
- Journal :
- IEEE International 2002 SOI Conference
- Publication Type :
- Conference
- Accession number :
- 81280943
- Full Text :
- https://doi.org/10.1109/SOI.2002.1044437