Accurate profiling of PN junction carrier concentration by scanning nonlinear dielectric microscopy (SNDM).

Details

Language :

English

ISBNs :

9780780381919

Database :

Complementary Index

Journal :

Fourth International Workshop on Junction Technology, 2004 (IWJT '04)

Publication Type :

Conference

Accession number :

81294180

Full Text :

https://doi.org/10.1109/IWJT.2004.1306766