Deffect profiling in the SiO2/ Al2O3 interface using Variable Tcharge-Tdischarge Amplitude Charge Pumping (VT2ACP).

Details

Language :

English

ISBNs :

9781424428885

Database :

Complementary Index

Journal :

2009 IEEE International Reliability Physics Symposium

Publication Type :

Conference

Accession number :

81322575

Full Text :

https://doi.org/10.1109/IRPS.2009.5173219