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In-situ TEM observation and electrical measurement of gold nanocontact during tensile test using MEMS opposing tips.

Authors :
Ishida, T.
Kakushima, K.
Fujita, H.
Source :
2009 22nd International Vacuum Nanoelectronics Conference; 2009, p169-170, 2p
Publication Year :
2009

Details

Language :
English
ISBNs :
9781424435876
Database :
Complementary Index
Journal :
2009 22nd International Vacuum Nanoelectronics Conference
Publication Type :
Conference
Accession number :
81396769
Full Text :
https://doi.org/10.1109/IVNC.2009.5271597