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In-situ TEM observation and electrical measurement of gold nanocontact during tensile test using MEMS opposing tips.
- Source :
- 2009 22nd International Vacuum Nanoelectronics Conference; 2009, p169-170, 2p
- Publication Year :
- 2009
Details
- Language :
- English
- ISBNs :
- 9781424435876
- Database :
- Complementary Index
- Journal :
- 2009 22nd International Vacuum Nanoelectronics Conference
- Publication Type :
- Conference
- Accession number :
- 81396769
- Full Text :
- https://doi.org/10.1109/IVNC.2009.5271597