Redundant core testing on the cell BE microprocessor.

MLA

Iverson, D., et al. “Redundant Core Testing on the Cell BE Microprocessor.” 2010 IEEE International Test Conference (ITC), Jan. 2010, pp. 1–6. EBSCOhost, https://doi.org/10.1109/TEST.2010.5699206.

APA

Iverson, D., Dickinson, D., Masson, J., Newman-LaBounty, C., Simmons, D., & Tanona, W. (2010). Redundant core testing on the cell BE microprocessor. 2010 IEEE International Test Conference (ITC), 1–6. https://doi.org/10.1109/TEST.2010.5699206

Chicago

Iverson, D., D. Dickinson, J. Masson, C. Newman-LaBounty, D. Simmons, and W. Tanona. 2010. “Redundant Core Testing on the Cell BE Microprocessor.” 2010 IEEE International Test Conference (ITC), January, 1–6. doi:10.1109/TEST.2010.5699206.