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An Automatic Generation Method of Wireless USB Test Cases for Wireless Environment.

Authors :
Hyunjeong Lee
Jongwon Kim
Jaedoo Huh
Source :
COIN-NGNCON 2006 - The Joint International Conference on Optical Internet & Next Generation Network; 2006, p171-173, 3p
Publication Year :
2006

Details

Language :
English
ISBNs :
9788995530146
Database :
Complementary Index
Journal :
COIN-NGNCON 2006 - The Joint International Conference on Optical Internet & Next Generation Network
Publication Type :
Conference
Accession number :
81581874
Full Text :
https://doi.org/10.1109/COINNGNCON.2006.4454600