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Study and reliability analysis on testing instrument for dynamic contact resistance on contact.

Authors :
Wen-hua Li
Guo-jin Liu
Zhi-gang Li
Source :
2000 Proceedings of the Forty-Sixth IEEE Holm Conference on Electrical Contacts, Electrical Contacts (Cat. No.00CB37081); 2000, p109-114, 6p
Publication Year :
2000

Details

Language :
English
ISBNs :
9780780359604
Database :
Complementary Index
Journal :
2000 Proceedings of the Forty-Sixth IEEE Holm Conference on Electrical Contacts, Electrical Contacts (Cat. No.00CB37081)
Publication Type :
Conference
Accession number :
81600603
Full Text :
https://doi.org/10.1109/HOLM.2000.889919