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A test structure for statistical evaluation of pn junction leakage current based on CMOS image sensor technology.
- Source :
- 2010 IEEE International Conference on Microelectronic Test Structures (ICMTS); 2010, p18-22, 5p
- Publication Year :
- 2010
Details
- Language :
- English
- ISBNs :
- 9781424469123
- Database :
- Complementary Index
- Journal :
- 2010 IEEE International Conference on Microelectronic Test Structures (ICMTS)
- Publication Type :
- Conference
- Accession number :
- 81630785
- Full Text :
- https://doi.org/10.1109/ICMTS.2010.5466868