A test structure for statistical evaluation of pn junction leakage current based on CMOS image sensor technology.

Details

Language :

English

ISBNs :

9781424469123

Database :

Complementary Index

Journal :

2010 IEEE International Conference on Microelectronic Test Structures (ICMTS)

Publication Type :

Conference

Accession number :

81630785

Full Text :

https://doi.org/10.1109/ICMTS.2010.5466868