Statistical evaluation of dynamic junction leakage current fluctuation using a simple arrayed capacitors circuit.

Details

Language :

English

ISBNs :

9781424454303

Database :

Complementary Index

Journal :

2010 IEEE International Reliability Physics Symposium (IRPS)

Publication Type :

Conference

Accession number :

81658722

Full Text :

https://doi.org/10.1109/IRPS.2010.5488751