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Statistical evaluation of dynamic junction leakage current fluctuation using a simple arrayed capacitors circuit.
- Source :
- 2010 IEEE International Reliability Physics Symposium (IRPS); 2010, p683-688, 6p
- Publication Year :
- 2010
Details
- Language :
- English
- ISBNs :
- 9781424454303
- Database :
- Complementary Index
- Journal :
- 2010 IEEE International Reliability Physics Symposium (IRPS)
- Publication Type :
- Conference
- Accession number :
- 81658722
- Full Text :
- https://doi.org/10.1109/IRPS.2010.5488751