Self consistent simulation for C-V characterization of sub 10nm Tri-Gate and Double Gate SOI FinFETs incorporating quantum mechanical effects.

Details

Language :

English

ISBNs :

9781424451869

Database :

Complementary Index

Journal :

2009 IEEE Student Conference on Research & Development (SCOReD)

Publication Type :

Conference

Accession number :

81658956

Full Text :

https://doi.org/10.1109/SCORED.2009.5443019