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On estimation of NBTI-Induced delay degradation.
- Source :
- 2010 15th IEEE European Test Symposium (ETS); 2010, p107-111, 5p
- Publication Year :
- 2010
Details
- Language :
- English
- ISBNs :
- 9781424458349
- Database :
- Complementary Index
- Journal :
- 2010 15th IEEE European Test Symposium (ETS)
- Publication Type :
- Conference
- Accession number :
- 81667933
- Full Text :
- https://doi.org/10.1109/ETSYM.2010.5512772