The importance of At-Speed Scan Testing: an industrial experience.

Authors :: Baronti, F.
Roncella, R.
Saletti, R.
D'Abramo, P.
Di Piro, L.
Fabian, H.
Giardi, M.
Source :: 10th Euromicro Conference on Digital System Design Architectures, Methods & Tools (DSD 2007); 2007, p672-675, 4p
Publication Year :: 2007

Language :: English
ISBNs :: 9780769529783
Database :: Complementary Index
Journal :: 10th Euromicro Conference on Digital System Design Architectures, Methods & Tools (DSD 2007)
Publication Type :: Conference
Accession number :: 81677487
Full Text :: https://doi.org/10.1109/DSD.2007.4341540