Fully integrated active magnetic probe for high-definition near-field measurement.

Details

Language :

English

ISBNs :

9781424402939

Database :

Complementary Index

Journal :

2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006

Publication Type :

Conference

Accession number :

81711929

Full Text :

https://doi.org/10.1109/ISEMC.2006.1706340