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Experimental characterization of the electron source at the Photo Injector Test facility at DESY Zeuthen.

Authors :
v Hartrott, M.
Jaeschke, E.
Kramer, D.
Carneiro, J.-P.
Flottmann, K.
Rossbach, J.
Schreiber, S.
Abrahamyan, K.
Bahr, J.
Bohnet, I.
Gensch, U.
Grabosch, H.-J.
Han, J.H.
Krasilnikov, M.
Lipka, D.
Oppelt, A.
Miltchev, V.
Petrossyan, B.
Stephan, F.
Michelato, P.
Source :
Proceedings of the 2003 Bipolar/BiCMOS Circuits & Technology Meeting (IEEE Cat. No.03CH37440); 2003, p2114-2114, 1p
Publication Year :
2003

Details

Language :
English
ISBNs :
9780780377387
Database :
Complementary Index
Journal :
Proceedings of the 2003 Bipolar/BiCMOS Circuits & Technology Meeting (IEEE Cat. No.03CH37440)
Publication Type :
Conference
Accession number :
81844861
Full Text :
https://doi.org/10.1109/PAC.2003.1288801