Classification of defects in solid insulation material by PD methods.

Authors :: Park, Y.G.
Lee, H.K.
Kim, W.S.
Lim, K.J.
Kang, S.H.
Ree, J.H.
Kim, B.H.
Source :: Proceedings of the 6th International Conference on Properties & Applications of Dielectric Materials (Cat. No.00CH36347); 2000, p749-749, 1p
Publication Year :: 2000

Language :: English
ISBNs :: 9780780354593
Database :: Complementary Index
Journal :: Proceedings of the 6th International Conference on Properties & Applications of Dielectric Materials (Cat. No.00CH36347)
Publication Type :: Conference
Accession number :: 81860526
Full Text :: https://doi.org/10.1109/ICPADM.2000.876338