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A novel approach to fault diagnostics and prognostics.

Authors :
Kwan, C.
Zhang, X.
Xu, R.
Haynes, L.
Source :
2003 IEEE International Conference on Robotics & Automation (Cat. No.03CH37422); 2003, p604-604, 1p
Publication Year :
2003

Details

Language :
English
ISBNs :
9780780377363
Database :
Complementary Index
Journal :
2003 IEEE International Conference on Robotics & Automation (Cat. No.03CH37422)
Publication Type :
Conference
Accession number :
81916052
Full Text :
https://doi.org/10.1109/ROBOT.2003.1241660