Back to Search Start Over

Reliability Accelerated Testing of MEMS Acccelerometers.

Authors :
Bazu, M.
Galateanu, L.
Ilian, V.E.
Loicq, J.
Habraken, S.
Colette, J.-P.
Source :
2007 International Semiconductor Conference; 2007, p103-106, 4p
Publication Year :
2007

Details

Language :
English
ISBNs :
9781424408474
Database :
Complementary Index
Journal :
2007 International Semiconductor Conference
Publication Type :
Conference
Accession number :
81935594
Full Text :
https://doi.org/10.1109/SMICND.2007.4519657
Full Text Access
View/download PDF

Tools

Authors Abstract Subjects Details