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Experimental and FDTD study of the EMI performance of an open-pin-field connector for modules-on-backplanes.

Authors :
Xiaoning Ye
Nadolny, J.
Drewniak, J.L.
DuBroff, R.E.
VanDoren, T.P.
Hubing, T.H.
Source :
IEEE International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.00CH37016); 2000, p789-789, 1p
Publication Year :
2000

Details

Language :
English
ISBNs :
9780780356771
Database :
Complementary Index
Journal :
IEEE International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.00CH37016)
Publication Type :
Conference
Accession number :
81967988
Full Text :
https://doi.org/10.1109/ISEMC.2000.874722