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The knowledge network of patenting and technology studies.

Authors :
Yender Lee
Etemad, H.
Source :
PICMET '01. Portland International Conference on Management of Engineering & Technology. Proceedings Vol.1: Book of Summaries (IEEE Cat. No.01CH37199); 2001, p77-77, 1p
Publication Year :
2001

Details

Language :
English
ISBNs :
9781890843069
Database :
Complementary Index
Journal :
PICMET '01. Portland International Conference on Management of Engineering & Technology. Proceedings Vol.1: Book of Summaries (IEEE Cat. No.01CH37199)
Publication Type :
Conference
Accession number :
81984127
Full Text :
https://doi.org/10.1109/PICMET.2001.951781