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Microwave characterization of thin film BST material using a simple measurement technique.
- Source :
- 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278); 2002, p1201-1204, 4p
- Publication Year :
- 2002
Details
- Language :
- English
- ISBNs :
- 9780780372399
- Database :
- Complementary Index
- Journal :
- 2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278)
- Publication Type :
- Conference
- Accession number :
- 82004914
- Full Text :
- https://doi.org/10.1109/MWSYM.2002.1011868