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Optimum test patterns for parity networks.

Authors :
Bossen, D. C.
Ostapko, D. L.
Patel, A. M.
Source :
Proceedings of the November 17-19, 1970, Fall Joint Computer Conference; 11/17/1970, p63-68, 6p
Publication Year :
1970

Details

Language :
English
Database :
Complementary Index
Journal :
Proceedings of the November 17-19, 1970, Fall Joint Computer Conference
Publication Type :
Conference
Accession number :
83796612
Full Text :
https://doi.org/10.1145/1478462.1478472